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Publications in Scientific Journals:

P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
"Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs";
Microelectronics Reliability, 55 (2015), 9-10; 1427 - 1432.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2015.06.021

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_sharma_1.pdf


Created from the Publication Database of the Vienna University of Technology.