Talks and Poster Presentations (with Proceedings-Entry):
P. Sharma, M. Jech, S. E. Tyaginov, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, T. Grasser:
"Modeling of Hot-Carrier Degradation in LDMOS Devices Using a Drift-Diffusion Based Approach";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Washington DC, USA;
2015-09-09
- 2015-09-11; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
(2015),
ISBN: 978-1-4673-7858-1;
60
- 63.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/SISPAD.2015.7292258
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Sharma_1.pdf
Created from the Publication Database of the Vienna University of Technology.