Publications in Scientific Journals:
P. Sharma, S. E. Tyaginov, M. Jech, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
"The Role of Cold Carriers and the Multiple-Carrier Process of Si-H Bond Dissociation for Hot-Carrier Degradation in n- and p-channel LDMOS Devices";
Solid-State Electronics,
115
(2016),
Part B;
185
- 191.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.sse.2015.08.014
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_sharma_2.pdf
Created from the Publication Database of the Vienna University of Technology.