Publications in Scientific Journals:
Yu. Illarionov, M. Bina, S. E. Tyaginov, K. Rott, B. Kaczer, H. Reisinger, T. Grasser:
"Extraction of the Lateral Position of Border Traps in Nanoscale MOSFETs";
IEEE Transactions on Electron Devices,
62
(2015),
9;
2730
- 2737.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2015.2454433
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_Illarionov_1.pdf
Created from the Publication Database of the Vienna University of Technology.