Talks and Poster Presentations (with Proceedings-Entry):
B. Kaczer, J. Franco, P. Weckx, P. Roussel, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, H. Kukner, P. Raghavan, F. Catthoor, G. Rzepa, W. Gös, T. Grasser:
"The Defect-Centric Perspective of Device and Circuit Reliability - From Individual Defects to Circuits";
Talk: European Solid-State Device Research Conference (ESSDERC),
Graz, Austria (invited);
2015-09-14
- 2015-09-18; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2015),
ISBN: 978-1-4673-7860-4;
218
- 225.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC.2015.7324754
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Kaczer_1.1.pdf
Created from the Publication Database of the Vienna University of Technology.