Doctor's Theses (authored and supervised):
Yu. Illarionov:
"Characterization and Modeling of Charged Defects in Silicon and 2D Field-Effect Transistors";
Supervisor, Reviewer: T. Grasser, L. Larcher;
Institut für Mikroelektronik,
2015;
oral examination: 2015-12-18.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2016.34580
Electronic version of the publication:
http://www.iue.tuwien.ac.at/phd/illarionov/
Created from the Publication Database of the Vienna University of Technology.