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Zeitschriftenartikel:

A Talai, F. Steinhäußer, A. Bittner, U. Schmid, R. Weigel, A Koelpin:
"A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz";
International Journal of Microwave and Wireless Technologies, 7 (2015), 3-4; S. 251 - 260.



Kurzfassung deutsch:
An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate
determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The
material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate
to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with
different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by
measurement results of different MUTs.

Kurzfassung englisch:
An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate
determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The
material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate
to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with
different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by
measurement results of different MUTs.

Schlagworte:
Characterization of material parameters; Microwave measurements


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1017/S1759078715000483


Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.