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A Talai, S. Mann, F. Steinhäußer, U. Schmid, R. Weigel, A. Bittner, A Koelpin:
"A Semi Double-Ridged quasi TE-Waveguide based Microwave Bulk Material Characterization System";
Talk: IEEE MTT-S International Microwave Symposium 2015, Phoenix, Arizona, USA; 05-17-2015 - 05-22-2015; in: "Proceedings of the IEEE MTT-S International Microwave Symposium 2015", IEEE, (2015), ISBN: 978-1-4799-8275-2.

Accurate microwave material characterization is
essential for reliable high frequency circuit design. Therefore, various
characterization techniques have been developed, comprising
advantages and drawbacks for the respective conditions. In this
paper, a material characterization system is presented, which
enables a broadband measurement for both dielectric loss and
relative permittivity of bulk substrates with variant geometrical
dimensions. Strips of different dielectric bulk materials under
test (MUTs) are mounted on top of an open semi doubleridged
waveguide. Differential phase and amplitude broadband
measurements with the MUTs are performed by a vector network
analyzer, providing information on the introduced change in
electrical length and dampening. The combined evaluation by
measurement and electromagnetic simulations allow broadband
assignments of the complex permittivity to the MUTs.

Accurate microwave material characterization is
essential for reliable high frequency circuit design. Therefore, various
characterization techniques have been developed, comprising
advantages and drawbacks for the respective conditions. In this
paper, a material characterization system is presented, which
enables a broadband measurement for both dielectric loss and
relative permittivity of bulk substrates with variant geometrical
dimensions. Strips of different dielectric bulk materials under
test (MUTs) are mounted on top of an open semi doubleridged
waveguide. Differential phase and amplitude broadband
measurements with the MUTs are performed by a vector network
analyzer, providing information on the introduced change in
electrical length and dampening. The combined evaluation by
measurement and electromagnetic simulations allow broadband
assignments of the complex permittivity to the MUTs.

Dielectric loss, material characterization, phase measurement, ridged waveguide, relative permittivity