Talks and Poster Presentations (with Proceedings-Entry):

T. Polzer, A. Steininger:
"Enhanced Metastability Characterization based on AC Analysis";
Talk: 18th Euromicro Conference on Digital System Design, Funchal, Portugal; 2015-08-26 - 2015-08-28; in: "18th Euromicro Conference on Digital System Design", (2015), 9 pages.

English abstract:
The common way of characterizing the metastability
properties of a circuit is by its metastability resolution
constant and the aperture window. This approach is based
on a model that represents the storage cell as a pair of crosscoupled
inverters, each of which is, in turn, modeled by a
constant-gain amplifier with a first-order low-pass filter at the
output. The former reflects the inverterīs signal regeneration
capability, while the latter approximates its dynamic behavior.
In this simple model there is no natural way of expressing,
e.g., the load dependence of , therefore each change of the
elementīs load capacitance requires a full recalibration.
In this paper we propose decomposing the inverter into its
constituent transistors and using their small-signal equivalent
circuits for modeling. Metastability characterization is now
based on a Spice AC analysis which yields a higher-order
dynamic model of the circuit. Once the relevant parameters
are known for a given element, the load dependence of can
be expressed analytically, thus elegantly avoiding recalibration.
We compare our approach with the extended nose short
simulation (ENSS) method from literature and show that the
results deviate by no more than 1-2%.

Created from the Publication Database of the Vienna University of Technology.