Talks and Poster Presentations (with Proceedings-Entry):
M. Bonta, A. Limbeck:
"Elemental mapping using LA-ICP-MS - a versatile tool for spatial trace element analysis";
Poster: 18. Tagung Festkörperanalytik,
Wien;
07-06-2015
- 07-08-2015; in: "Kurzfassungen",
(2015),
61.
English abstract:
Nowadays, laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is widely used for the direct sampling of solid specimens. Besides the determination of bulk concentrations, also the depiction of analyte distributions across a selected area of the sample (elemental mapping or imaging) is possible. One major advantage of LA-ICP-MS in contrast to other analytical techniques used for surface mapping is the high sensitivity for a majority of elements with limits of detection below the low μg/g-scale with the possibility of simultaneous analysis of trace and bulk sample constituents. The application range of LA ICP-MS imaging is wide, spreading from the biosciences to material sciences. Specifically, in this work, four application examples will be presented: a tissue sample, a drilled core from a concrete structure, a structured electrode used in the semiconductor industry, and a sintered powder metallurgy steel sample. Lateral resolutions between 5 and 100 μm were achieved, mainly limited by the analyte concentrations.
Keywords:
LA-ICP-MS, imaging, elemental analysis
Created from the Publication Database of the Vienna University of Technology.