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J. Choi:
"Ultrathin ZrO₂: surface structure is decisive for oxide properties";
Vortrag: Seminar IAP TU Wien, TU Wien; 15.03.2016.

Although zirconia (ZrO2) finds a wide range of applications in engineering, catalysis, microelectronics and solid oxide fuel cells (SOFCs), atomic-level studies of its surface structure are difficult due to its insulating nature, related to its high band gap (Eg ≈ 5 eV). In order to overcome this limitation, ultrathin zirconia films were grown by oxidation of Zr-based alloys (Pt3Zr [1] and Pd3Zr [2]), and the structure of these films was studied by STM. In this talk, I will present atomically resolved STM measurements of the films and the adsorption of H2O and atomic H as well as deposition of metals (Ag, Au, Pd, Ni, Fe) at these surfaces. Combined studies by STM and DFT reveals that the surface structure of the ultrathin oxide is a decisive factor that determines the interaction of the oxide with the molecules and the metals.

[1] Antlanger et al., Phys. Rev. B 86, 035451 (2012).
[2] Choi et al., J. Phys.: Condens. Matter 26, 225003 (2014).