Publications in Scientific Journals:
S. E. Tyaginov, M. Jech, J. Franco, P. Sharma, B. Kaczer, T. Grasser:
"Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON n-MOSFETs";
IEEE Electron Device Letters,
37
(2016),
1;
84
- 87.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/LED.2015.2503920
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.