Talks and Poster Presentations (with Proceedings-Entry):
R. Stradiotto, G. Pobegen, C. Ostermaier, T. Grasser:
"On The Fly Characterization of Charge Trapping Phenomena at GaN/Dielectric and GaN/AlGaN/Dielectric Interfaces Using Impedance Measurements";
Talk: European Solid-State Device Research Conference (ESSDERC),
Graz;
09-14-2015
- 09-18-2015; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2015),
ISBN: 978-1-4673-7860-4;
218
- 225.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC.2015.7324754
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Stradiotto_1.pdf
Created from the Publication Database of the Vienna University of Technology.