Talks and Poster Presentations (with Proceedings-Entry):
M. Waltl, A. Grill, G. Rzepa, W. Gös, J. Franco, B. Kaczer, J. Mitard, T. Grasser:
"Nanoscale Evidence for the Superior Reliability of SiGe High-k pMOSFETs";
Poster: International Reliability Physics Symposium (IRPS),
Pasadena, CA, USA;
2016-04-17
- 2016-04-21; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2016),
XT-02-1
- XT-02-6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2016.7574644
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/CP2016_Waltl_1.pdf
Created from the Publication Database of the Vienna University of Technology.