Talks and Poster Presentations (with Proceedings-Entry):
A. Grill, G. Rzepa, P. Lagger, C. Ostermaier, H. Ceric, T. Grasser:
"Charge Feedback Mechanisms at Forward Threshold Voltage Stress in GaN/AlGaN HEMTs";
Talk: IEEE International Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
10-11-2015
- 10-15-2015; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2015),
ISBN: 978-1-4673-7395-1;
41
- 45.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2015.7437064
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/CP2016_Grill_1.pdf
Created from the Publication Database of the Vienna University of Technology.