Publications in Scientific Journals:
Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser:
"Bias-Temperature Instability on the Back Gate of Single-Layer Double-Gated Graphene Field-Effect Transistors";
Japanese Journal of Applied Physics,
55
(2016),
4S;
04EP03.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.7567/JJAP.55.04EP03
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Illarionov_1.pdf
Created from the Publication Database of the Vienna University of Technology.