Talks and Poster Presentations (with Proceedings-Entry):
S. E. Tyaginov, M. Jech, P. Sharma, J. Franco, B. Kaczer, T. Grasser:
"On the Temperature Behavior of Hot-Carrier Degradation";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
10-11-2015
- 10-15-2015; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2015),
143
- 146.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2015.7437088
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/CP_2016_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.