Talks and Poster Presentations (with Proceedings-Entry):
K. Giering, G.A. Rott, G. Rzepa, H. Reisinger, A. Puppala, T. Reich, W. Gustin, T. Grasser, R. Jancke:
"Analog-circuit NBTI Degradation and Time-dependent NBTI Variability: An Efficient Physics-Based Compact Model";
Talk: International Reliability Physics Symposium (IRPS),
Pasadena, CA, USA;
2016-04-17
- 2016-04-21; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2016),
4C-4-1
- 4C-4-6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2016.7574540
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/CP2016_Rzepa_2.pdf
Created from the Publication Database of the Vienna University of Technology.