Doctor's Theses (authored and supervised):
M. Waltl:
"Experimental Characterization of Bias Temperature Instabilities in Modern Transistor Technologies";
Supervisor, Reviewer: T. Grasser, D. Schmitt-Landsiedel;
Institut für Mikroelektronik,
2016;
oral examination: 2016-09-09.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2016.38201
Electronic version of the publication:
https://www.iue.tuwien.ac.at/phd/waltl/
Created from the Publication Database of the Vienna University of Technology.