Publications in Scientific Journals:
B. Kaczer, J. Franco, P. Weckx, Ph. J. Roussel, M. Simicic, V. Putcha, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, P. Debacker, B. Parvais, P. Raghavan, F. Catthoor, G. Rzepa, M. Waltl, W. Gös, T. Grasser:
"The Defect-Centric Perspective of Device and Circuit Reliability - From Gate Oxide Defects to Circuits";
Solid-State Electronics,
125
(2016),
52
- 62.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.sse.2016.07.010
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Rzepa_1.pdf
Created from the Publication Database of the Vienna University of Technology.