Publications in Scientific Journals:
Yu. Illarionov, M. Waltl, G. Rzepa, J. Kim, S. Kim, A. Dodabalapur, D. Akinwande, T. Grasser:
"Long-Term Stability and Reliability of Black Phosphorus Field-Effect Transistors";
ACS Nano,
10
(2016),
10;
9543
- 9549.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1021/acsnano.6b04814
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Illarionov_3.pdf
Created from the Publication Database of the Vienna University of Technology.