Publications in Scientific Journals:
E. Brinciotti, G. Badino, M. Knaipp, G. Gramse, J. Smoliner, F. Kienberger:
"Calibrated Nanoscale Dopant Profiling and Capacitance of a High-Voltage Lateral MOS Transistor at 20 GHz Using Scanning Microwave Microscopy";
IEEE Transactions on Nanotechnology,
16
(2017),
2;
245
- 252.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TNANO.2017.2657888
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2017_Brinciotti_01.pdf
Created from the Publication Database of the Vienna University of Technology.