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Publications in Scientific Journals:

E. Brinciotti, G. Badino, M. Knaipp, G. Gramse, J. Smoliner, F. Kienberger:
"Calibrated Nanoscale Dopant Profiling and Capacitance of a High-Voltage Lateral MOS Transistor at 20 GHz Using Scanning Microwave Microscopy";
IEEE Transactions on Nanotechnology, 16 (2017), 2; 245 - 252.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TNANO.2017.2657888

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2017_Brinciotti_01.pdf


Created from the Publication Database of the Vienna University of Technology.