Talks and Poster Presentations (with Proceedings-Entry):
B. Ullmann, M. Jech, S. E. Tyaginov, M. Waltl, Yu. Illarionov, A. Grill, K. Puschkarsky, H. Reisinger, T. Grasser:
"The Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on Single Oxide Defects";
Poster: International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2017-04-04
- 2017-04-06; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2017),
ISBN: 978-1-5090-6642-1;
XT-10.1
- XT-10.6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2017.7936424
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Ullmann_1.pdf
Created from the Publication Database of the Vienna University of Technology.