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Publications in Scientific Journals:

R. Stradiotto, G. Pobegen, C. Ostermaier, M. Waltl, A. Grill, T. Grasser:
"Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTs";
IEEE Transactions on Electron Devices, 64 (2017), 3; 1045 - 1052.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2017.2655367

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2017/JB2017_Waltl_3.pdf


Created from the Publication Database of the Vienna University of Technology.