Talks and Poster Presentations (with Proceedings-Entry):
Yu. Illarionov, G. Rzepa, M. Waltl, T. Knobloch, J. Kim, D. Akinwande, T. Grasser:
"Accurate Mapping of Oxide Traps in Highly-Stable Black Phosphorus FETs";
Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM),
Toyama, Japan;
2017-02-28
- 2017-03-02; in: "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)",
(2017),
ISBN: 978-1-5090-4661-4;
114
- 115.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/EDTM.2017.7947532
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Illarionov_1.pdf
Created from the Publication Database of the Vienna University of Technology.