Talks and Poster Presentations (with Proceedings-Entry):
Yu. Illarionov, M. Waltl, M. Jech, J. Kim, D. Akinwande, T. Grasser:
"Reliability of Black Phosphorus Field-Effect Transistors with Respect to Bias-Temperature and Hot-Carrier Stress";
Talk: International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2017-04-02
- 2017-04-06; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2017),
ISBN: 978-1-5090-6642-1;
6A-6.1
- 6A-6.6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2017.7936338
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Illarionov_2.pdf
Created from the Publication Database of the Vienna University of Technology.