Talks and Poster Presentations (with Proceedings-Entry):
A. Grill, B. Stampfer, M. Waltl, K.-S. Im, J. Lee, C. Ostermaier, H. Ceric, T. Grasser:
"Characterization and Modeling of Single Defects in GaN/AlGaN Fin-MIS-HEMTs";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2017-04-02
- 2017-04-06; in: "Proceedings of IEEE International Reliability Physics Symposium (IRPS)",
(2017),
ISBN: 978-1-5090-6641-4;
3B-5.1
- 3B-5.5.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2017.7936285
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Grill_1.pdf
Created from the Publication Database of the Vienna University of Technology.