[Zurück]


Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

M. Steinegger, M. Melik-Merkumians, J. Zajc, G. Schitter:
"A Framework for Automatic Knowledge-Based Fault Detection in Industrial Conveyor Systems";
Vortrag: 22nd IEEE International Conference on Emerging Technologies And Factory Automation, Limassol, Zypern; 13.09.2017 - 15.09.2017; in: "Proceedings on 22nd IEEE International Conference on Emerging Technologies And Factory Automation", (2017), Paper-Nr. 222, 6 S.



Kurzfassung englisch:
In this paper, a framework for automatic generation
of a flexible and modular system for fault detection and diagnosis
(FDD) is proposed. The method is based on an ontology-based integration
framework, which gathers the information from various
engineering artifacts. Based on the ontologies, FDD functions are
generated based on structural and procedural generation rules.
The rules are encoded as SPARQL queries which automatically
build logical segments of the entire manufacturing system in
the ontology, assign sub-processes to these segments, and finally
generate the appropriate FDD system for the sub-process. These
generated modular FDD functions are additionally combined in
a modular way to enable the fault detection and diagnosis of the
entire system. The effectiveness of the approach is demonstrated
by a first application to a conveyor system.

Schlagworte:
Knowledge, Ontology, Code Generation, Fault Detection


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ETFA.2017.8247705

Elektronische Version der Publikation:
https://publik.tuwien.ac.at/files/publik_262909.pdf


Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.