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Contributions to Proceedings:

A. Gabdulkhakova, W. Kropatsch:
"Detecting ellipses in elongated shapes using the thickness profile";
in: "Joint IAPR International Workshops on Statistical Techniques in Pattern Recognition (SPR) and Structural and Syntactic Pattern Recognition (SSPR)", Springer, Cham, 2016, ISBN: 978-3-319-49055-7, 412 - 423.



English abstract:
This paper presents a method that detects elliptical parts of a given elongated shape. For this purpose, first, the shape is represented by its skeleton. In case of branches, the skeleton is partitioned into a set of lines/curves. Second, the ellipse parameters are estimated using the thickness profile along each line/curve, and the properties of its first and second derivatives. The proposed method requires no prior information about the model, number of ellipses and their parameter values. The detected ellipses are then used in our second proposed approach for ellipse-based shape description. It can be applied for analysing motion and deformation of biological objects like roots, worms, and diatoms.

Keywords:
Shape analysis Shape description Ellipse detection


"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-319-49055-7_37

Electronic version of the publication:
http://publik.tuwien.ac.at/files/publik_263907.pdf


Created from the Publication Database of the Vienna University of Technology.