Talks and Poster Presentations (without Proceedings-Entry):
M. Mitrovic, M. Hofbauer, K. Schneider-Hornstein, B. Goll, K.O. Voss, H. Zimmermann:
"Evidence of Pulse Quenching in AND gates in 65 nm Bulk CMOS by Experimental Probing of Full Single-Event Transient Waveforms";
Poster: IEEE Nuclear and Space Radiation Effects Conference,
New Orleans, Louisiana;
07-17-2017
- 07-21-2017.
English abstract:
Full waveforms of single-event transients in AND2 gates under focused heavy-ion micro-beam irradiation were experimentally measured, showing evidence of charge-sharing induced pulse quenching, depending on hit position and logic state.
Created from the Publication Database of the Vienna University of Technology.