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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

M. Shawrav, N. Cazier, S. Waid, M. Schinnerl, H. D. Wanzenböck, S. Schmid:
"FIB investigations on FEBID based gold nanostructures";
Poster: 1st European FIB Network Workshop, Graz, Austria; 04.07.2017 - 05.07.2017; in: "1st European FIB Network Workshop", (2017), S. 107 - 108.



Kurzfassung deutsch:
Focused Ion beam (FIB) is one of the versatile tools in modern research, which offers both additive and subtractive nanofabrication possibilities. The subtractive part or FIB milling is very popular nano-analysis method and ideal way to investigate samples with small feature size. Among various other materials, FIB can be used to process gold nanostructures. This work will compare the FIB milling of gold nanostructures fabricated on different substrate.

Kurzfassung englisch:
Focused Ion beam (FIB) is one of the versatile tools in modern research, which offers both additive and subtractive nanofabrication possibilities. The subtractive part or FIB milling is very popular nano-analysis method and ideal way to investigate samples with small feature size. Among various other materials, FIB can be used to process gold nanostructures. This work will compare the FIB milling of gold nanostructures fabricated on different substrate.

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.