Talks and Poster Presentations (with Proceedings-Entry):

M. Andjelkovic, M. Krstic, R. Kraemer, V. S. Veeravalli, A. Steininger:
"A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study";
Talk: The 26th IEEE Asian Test Symposium (ATSī17), Taipei, Taiwan; 2017-11-27 - 2017-11-30; in: "Proceedings of the 26th IEEE Asian Test Symposium (ATSī17)", (2017), 1 - 6.

English abstract:
This paper presents a critical charge model for
estimating the SET and SEU robustness. The proposed model has
been derived by analytic fitting of SPICE results, using a Muller
C-element designed in 65 and 130 nm bulk CMOS technologies
as the target device. The critical charge is expressed in terms of
the size of C-element, size of load inverter, supply voltage and
temperature, for constant timing parameters of the SET/SEU
current pulse. The proposed model could be utilized to calculate
the critical charge causing a SET, for both analyzed technologies,
with the accuracy comparable to SPICE simulations. The critical
charge for SEU was higher than for SET, but the dependencies
obtained for SET response were qualitatively similar to those for
SEU. This implies that the proposed critical charge model may be
applicable for optimizing the SET/SEU robustness evaluation of
the circuits involving the Muller C-element. Moreover, the model
may also serve as a basis for evaluating the SET/SEU robustness
of other standard cells and other technologies, and thus also for
analysis of the SET/SEU robustness of complex circuits.

Critical charge; Muller C-element; SET effects; SEU effects; SPICE simulations

Created from the Publication Database of the Vienna University of Technology.