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Publications in Scientific Journals:

J. Stathis, S. Mahapatra, T. Grasser:
"Controversial Issues in Negative Bias Temperature Instability";
Microelectronics Reliability, 81 (2018), 244 - 251.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2017.12.035

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Grasser_1.pdf


Created from the Publication Database of the Vienna University of Technology.