Publications in Scientific Journals:
B. Kaczer, J. Franco, P. Weckx, Ph. J. Roussel, V. Putcha, E. Bury, M. Simicic, A. Chasin, D. Linten, B. Parvais, F. Catthoor, G. Rzepa, M. Waltl, T. Grasser:
"A Brief Overview of Gate Oxide Defect Properties and Their Relation to MOSFET Instabilities and Device and Circuit Time-Dependent Variability";
Microelectronics Reliability (invited),
81
(2018),
186
- 194.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2017.11.022
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Rzepa_1.pdf
Created from the Publication Database of the Vienna University of Technology.