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Publications in Scientific Journals:

G. Schitter, P. J. Thurner, P.K. Hansma:
"Design and input-shaping control of a novel scanner for high speed atomic force microscopy";
Mechatronics, 18 (2008), 282 - 288.



English abstract:
A novel design of a scanning unit for atomic force microscopy (AFM) is presented that enables scanning speeds three orders of magnitude
faster than compared to conventional AFMs. The new scanner is designed for high mechanical resonance frequencies, based on a
new scanner design, which is optimized using finite element analysis. For high-speed scanning a new controller, based on input-shaping
techniques, has been developed that reduces imaging artifacts due to the scannerīs dynamics. The implementation of the new AFM system
offers imaging capabilities of several thousand lines per second with a scanning range of 13 lm in both scanning directions, and the
freedom to choose the fast scan-axis in any arbitrary direction in the X-Y-plane.

Keywords:
AFM; Fast scanning; Nano-positioning; Nanotechnology; Scanning probe; Real-time imaging; Mechanical design

Created from the Publication Database of the Vienna University of Technology.