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Publications in Scientific Journals:

G. Schitter, F. Allgöwer, A. Stemmer:
"A new control strategy for high-speed atomic force microscopy";
Nanotechnology, 15 (2004), 108 - 114.



English abstract:
An advanced controller consisting of a feedback and feedforward part is
presented to improve the performance of an atomic force microscope (AFM)
enabling topography measurements at higher scan rates with a reduced
measurement error. The tip-sample interaction force is held constant by an
H∞-controller while the scanner is simultaneously tracked to the topography
of the last recorded scan line by a model-based feedforward controller. The
designed controller is implemented on a commercial AFM system to
compare the performance to a standard proportional integral controlled
AFM. The new controller reduces the measurement error and enables
imaging at higher speeds and at smaller tip-sample interaction forces.

Created from the Publication Database of the Vienna University of Technology.