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Publications in Scientific Journals:

R. Stark, G. Schitter, A. Stemmer:
"Tuning the interaction forces in tapping mode atomic-force microscopy";
Physical Review B, 68 (2003).



English abstract:
The driving frequency is a key parameter to determine the tip-sample interaction forces in tapping mode
atomic force microscopy ~AFM!. By adjusting the driving frequency slightly above the resonance frequency
stable imaging with net attractive forces can be achieved almost independently from the quality factor of the
cantilever. A reduction of the driving frequency below the resonance leads to a repulsive imaging regime with
minimized repulsive forces. Numerical simulations as well as experiments show the influence on the interaction
forces between tip and sample. Appropriate adjustment of the excitation frequency in dynamic AFM
allows one to adjust the interaction forces over the entire range from net attractive to net repulsive.

Created from the Publication Database of the Vienna University of Technology.