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D. Abramovich, S. Andersson, L. Pao, G. Schitter:
"A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes";
Talk: 2007 American Control Conference, New York (USA); 07-11-2007 - 07-13-2007; in: "Proceedings of the 2007 American Control Conference", (2007), 3488 - 3502.

The Atomic Force Microscope (AFM) is one of the
most versatile tools in nanotechnology. For control engineers
this instrument is particularly interesting, since its ability to
image the surface of a sample is entirely dependent upon the
use of a feedback loop. This paper will present a tutorial on
the control of AFMs. We take the reader on a walk around
the control loop and discuss each of the individual technology
components. The major imaging modes are described from a
controls perspective and recent advances geared at increasing
the performance of these microscopes are highlighted.