Talks and Poster Presentations (with Proceedings-Entry):
G. Schitter:
"Advanced mechanical design and control methods for atomic force microscopy in real-time";
Talk: 2007 American Control Conference,
New York (USA);
07-11-2007
- 07-13-2007; in: "Proceedings of the 2007 American Control Conference",
(2007),
3503
- 3508.
English abstract:
This article reviews mechanical design and
control of atomic force microscopes (AFM) with
a special emphasis on high-speed imaging. The
mechanical design and the control system determine
the achievable imaging speed of the AFM.
To enable AFM imaging at video-rates, imaging
speed - and thus system performance - has to be
increased by at least two orders of magnitude relative
to today´s commercial AFMs. Methods and
results presented in this paper demonstrate how
this can be achieved.
Created from the Publication Database of the Vienna University of Technology.