Talks and Poster Presentations (with Proceedings-Entry):
G. Schitter, G. Fantner, P. J. Thurner, J. Adams, P.K. Hansma:
"Design and characterization of a novel scanner for high-speed atomic force microscopy";
Talk: 4th IFAC Symposium on Mechatronic Systems,
Heidelberg (Germany);
09-12-2006
- 09-14-2006; in: "Proceedings of the 4th IFAC Symposium on Mechatronic Systems",
(2006),
819
- 824.
English abstract:
A novel design of a scanning unit for atomic force microscopy (AFM) is
presented that enables scanning speeds three orders of magnitude faster than commercial
AFMs. The new scanner concept is based on flexures that decouple the axes of motion
and clamp the actuators on both sides in order to shorten the mechanical path lengths to a
functional minimum. The positioner is designed for high mechanical resonance
frequencies by optimizing the structure using finite element analysis. The implementation
of the new system offers imaging capabilities of several thousand lines per second with a
scanning range of 13 micrometers in both scanning directions, and the freedom to rotate
the image.
Keywords:
AFM, fast scanning, nano-positioning, nanotechnology, scanning probe, realtime imaging, mechanical design
Created from the Publication Database of the Vienna University of Technology.