Talks and Poster Presentations (with Proceedings-Entry):
G. Schitter, K. Åström, B. DeMartini, K. Turner, G. Fantner, P. J. Thurner, P.K. Hansma:
"Design and modeling of a high-speed scanner for atomic force microscopy";
Talk: 2006 American Control Conference,
Minneapolis (USA);
2006-06-14
- 2006-06-16; in: "Proceedings of the 2006 American Control Conference",
(2006),
502
- 507.
English abstract:
A new scanner design for a high-speed atomic
force microscope (AFM) is presented and discussed in terms of
modeling and control. The lowest resonance frequency of this
scanner is above 22 kHz. The X and Y scan ranges are 13
micrometers and the Z range is 4.3 micrometers. The focus of
this contribution is on the vertical positioning direction of the
scanner, being the crucial axis of motion with the highest
bandwidth and precision requirements for gentle imaging with
the atomic force microscope. A mathematical model of the
scanner dynamics is presented that will enable more accurate
topography measurements with the high-speed AFM system.
Created from the Publication Database of the Vienna University of Technology.