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G. Schitter, G. Fantner, J. Kindt, P. J. Thurner, P.K. Hansma:
"On recent developments for high-speed atomic force microscopy";
Vortrag: IEEE/ASME International Conference on Advanced Intelligent Mechatronics AIM2005, Piscataway (USA); 2005; in: "Proceedings IEEE/ASME International Conference on Advanced Intelligent Mechatronics AIM2005", (2005), S. 261 - 264.

The atomic force microscope (AFM) is limited in
imaging speed by the bandwidth and dynamic behavior of the
actuators and mechanical parts. For high-speed imaging all
AFM components have to be optimized in performance. Here,
we present improvements of the force sensor, the scanner, the
controller, and the data acquisition system. By combining all
these improvements, the next generation AFMs will enable
imaging speeds more than two orders of magnitude faster than
current commercial AFM systems.