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J. Rieber, G. Schitter, A. Stemmer, F. Allgöwer:
"Experimental application of l1-optimal control for an atomic force microscope";
Talk: 16th Triennial IFAC World Congress, Prague (Czech Republic); 07-04-2005 - 07-08-2005; in: "Proceedings of the 16th Triennial IFAC World Congress", (2005), 664 - 669.

This paper presents an experimental application of `1-optimal control. In
an atomic force microscope, the vertical position of the piezoelectric tube scanner
and thus the cantilever de
ection is controlled using a 2-degree-of-freedom control
design. The last recorded scan line is fed forward whereas a feedback controller
provides stability and setpoint control. Experimental results verify the performance
of the approach and give insight into applicability, design, and implementation
aspects of l1-optimal controllers.

l1-optimal control, 2-DOF control design, atomic force microscopy, experimental application