Publications in Scientific Journals:
S. E. Tyaginov, A. Makarov, M. Jech, M. I. Vexler, J. Franco, B. Kaczer, T. Grasser:
"Physical Principles of Self-Consistent Simulation of the Generation of Interface States and the Transport of Hot Charge Carriers in Field-Effect Transistors Based on Metal-Oxide-Semiconductor Structures";
Semiconductors (Physics of Semiconductor Devices),
52
(2018),
2;
242
- 247.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1134/S1063782618020203
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.