Talks and Poster Presentations (with Proceedings-Entry):
A. Makarov, S. E. Tyaginov, B. Kaczer, M. Jech, A. Chasin, A. Grill, G. Hellings, M. Vexler, D. Linten, T. Grasser:
"Hot-Carrier Degradation in FinFETs: Modeling, Peculiarities, and Impact of Device Topology";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA;
12-02-2017
- 12-06-2017; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2017),
ISBN: 978-1-5386-3559-9;
310
- 313.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2017.8268381
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2017_Makarov_1.pdf
Created from the Publication Database of the Vienna University of Technology.