Talks and Poster Presentations (with Proceedings-Entry):
P. Sharma, S. E. Tyaginov, S. E. Rauch, J. Franco, B. Kaczer, A. Makarov, M. Vexler, T. Grasser:
"A Drift-Diffusion-Based Analytic Description of the Energy Distribution Function for Hot-Carrier Degradation in Decananometer nMOSFETs";
Talk: European Solid-State Device Research Conference (ESSDERC),
Lausanne, Switzerland;
09-12-2016
- 09-15-2016; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2016),
ISBN: 978-1-5090-2969-3;
428
- 431.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC.2016.7599677
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2016_Makarov_2.pdf
Created from the Publication Database of the Vienna University of Technology.