Talks and Poster Presentations (with Proceedings-Entry):
S. E. Tyaginov, A. Makarov, M. Jech, J. Franco, P. Sharma, B. Kaczer, T. Grasser:
"On the Effect of Interface Traps on the Carrier Distribution Function During Hot-Carrier Degradation";
Poster: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
10-09-2016
- 10-13-2016; in: "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)",
(2016),
ISBN: 978-1-5090-4193-0;
95
- 98.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2016.7904911
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2016_Makarov_3.pdf
Created from the Publication Database of the Vienna University of Technology.