Talks and Poster Presentations (with Proceedings-Entry):
Yu. Illarionov, A.J. Molina- Mendoza, M. Waltl, T. Knobloch, M. M. Furchi, T. Mueller, T. Grasser:
"Reliability of next-generation field-effect transistors with transition metal dichalcogenides";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Burlingame, CA, USA;
03-11-2018
- 03-15-2018; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2018),
ISBN: 978-1-5386-5479-8;
6 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2018.8353605
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2018_Illarionov_1.pdf
Created from the Publication Database of the Vienna University of Technology.