Contributions to Books:
J. Lorenz, A. Asenov, E. Baer, S. Barraud, C. Millar, M. Nedjalkov:
"Process Variability for Devices at and Beyond the 7nm Node";
in: "Advanced CMOS-Compatible Semiconductor Devices 18, Vol. 85, No. 8",
J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen, A. Yoshino (ed.);
issued by: The Electrochemical Society;
ECS Transactions,
2018, (invited),
ISBN: 978-1-62332-488-9,
113
- 124.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/08508.0151ecst
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/BC2018_Nedjalkov_1.pdf
Created from the Publication Database of the Vienna University of Technology.