Talks and Poster Presentations (with Proceedings-Entry):
M. Fürst, S. Unger, S. Ito, G. Schitter:
"Wavefront measurement based feedback control for automatic alignment of a high-NA optical system";
Talk: XXII World Congress of the International Measurement Confederation (IMEKO),
- 09-06-2018; in: "XXII World Congress of the International Measurement Confederation (IMEKO)",
Many applications of optical systems depend on focal spot quality, which depends
on the alignment of the optical components. During alignment, it is di cult to monitor the spot
quality because the spot position shifts with the alignment. This paper proposes to compensate
for displacements of the focal spot and to monitor the spot quality by controlling the position of
a Shack-Hartmann sensor. Low-order aberration data is used to control the position of a Shack-
Hartmann sensor while higher-order aberrations are used to estimate focal spot quality. An
experimental high numerical aperture setup is presented and the proposed method is applied.
The experimental results successfully demonstrate the automatic alignment capabilities.
Created from the Publication Database of the Vienna University of Technology.